Title: An Expert System for Visual Inspection of IC Leadframes

Author(s): George Dainis, Texas Instruments, Inc., Attleboro, MA, and Matthew O. Ward, Computer Science Department, Worcester Polytechnic Institute, Worcester, MA 01609

Source: Proc. of First World Congress on Expert Systems, 1991.

Abstract: This paper concerns the design, implementation, and testing of an expert system for visual inspection of the physical attributes of a manufactured product. The target product for this inspection is Integrated Circuit Leadframes. Inspection of both profile and surface finish defects is performed. As implemented, the system functions off-line from the production equipment in a non-real-time mode, using images obtained through the digitization of photographs of the product taken through a low power microscope. A frame based representation system is used to describe the product and defect categories. The system uses multiple levels of visual inspection to identify generic and specific inspection targets and defect categories.